What's New
Call for Papers/ Tutorials/ Proposals:
IEEE 5G World Forum
Call for Special Sessions and Workshops
Learn more.
IEEE Transactions on Vehicular Technology: Vehicle Connectivity and Automation Using 5G Networks
Learn more.
IEEE Vehicular Technology Magazine: 5G and Beyond Technologies
Learn more.
IEEE Future Networking Workshop for 5G and Beyond Testbed and Trials
Learn more.
IEEE Future Networks Webinar Series on Demand:
Mitigating Thermal & Power Limitations to Enable 5G
Dr. Earl McCune, CTO, Eridan Communications
View Webinar
IEEE Workshop on 5G Technologies for Tactical and First Responder Networks
View recordings and presentations of the workshop held 23 October 2018
Learn more.
IEEE - TDSI 5G Technologies Workshop at IMC 2018
View recordings and presentations of the workshop held 26 October 2018
Link to the recorded webcast.
Link to view the program and presentations.
Link to view pictures from the event.
Feature Article
Test and Measurement is a Major Hurdle for 5G
Back in June of this year, the component technologies for 5G continued their inexorable march forward with Release 15 of the 5G New Radio specifications. These let equipment manufacturers know the standards network gear must meet to enable 5G networks.
Read more at IEEE Spectrum.
India’s Ambitious Project for Nationwide Public Internet
Read more at IEEE Transmitter.
IEEE 5G Working Group Finishes Fronthaul Standard
Technology Spotlight
IEEE Future Networks Tech Focus: December 2018
Read our lastest newsletter with articles on: RAN slicing, artificial intelligence in support of architecture evolution, and regulatory and competition challenges for 5G.
Massive MIMO Will Create More Wireless Channels, But Also More Vulnerabilities
Read more at IEEE Spectrum.
The 5G Dilemma: More Base Stations, More Antennas - Less Energy?
The Race to 5G: The Latest 5G News and Analysis
Useful Links
- Join the Team - Call for Volunteers
- Distinguished Lecturer Program
- IEEE ComSoc Technology Blog
- IEEE 5G Summit
- IEEE Future Directions Talks Future Networks: Read Q&A Interviews with IEEE experts
